A SYSTEM AND METHOD FOR DETECTING PLAGIARISM, Patent No. PI 2016701246, Date Open to Public 05/10/2017.
A SYSTEM AND METHOD FOR DETECTING PLAGIARISM, Patent No. PI 2016701247, Date Open to Public 05/10/2017.
http://ipjournal.myipo.gov.my/ipjournal/index.cfm?pg=publication/18month_details&id=10&year=2017